The Future of NIST Technical Evaluations of Biometric Technologies

Join us for a special webinar presented by the Security Industry Association (SIA) Identity and Biometric Technology Advisory Board, with support from sponsors Leidos and SAIC and featuring special guest Patrick Grother, a scientist with the National Institute of Standards and Technology (NIST).

Grother will provide an update specific to recent changes to the NIST Face Recognition Technology Evaluation (FRTE) and Face Analysis Technology Evaluation (FATE) programs, as well as future plans across key NIST evaluations of biometric technologies that have implications for key stakeholders across industry and government. These topics will be of particular interest to developers participating or considering participation in these programs, manufacturers and integrators providing biometric technologies within their products and end users in the government and commercial sectors.

About the Speaker

Patrick Grother is a scientist at the National Institute of Standards and Technology, where he is responsible for work on biometric standards and testing. He leads the IRis EXchange, Face Recognition Vendor Test and Face in Video Evaluation (FIVE) programs for iris and face recognition technologies that support biometrics in national scale identity management and co-chairs NIST’s International Face Performance Conference on measurement, metrics and certification. Grother also assists a number of US Government agencies in research, development and evaluation, and he has briefed senior government officials, the Army and Defense Science Boards. He serves as chair of the SC37 committee on biometrics and is editor of six International Organization for Standardization standards there. Grother also edits the biometrics specifications for the US Government’s Personal Identity Verification credentialing program, for which he received his second U.S. Department of Commerce Gold Medal. He also received the International Electrotechnical Commission 1906 award in 2009 and the American National Standards Institute Lohse IT Medal in 2013.

Thank You to Our Event Sponsors